An element-specific study of magnetic multilayers
Z.Q. Qiu
Department of Physics,
In a magnetic multilayer structure, interesting properties often stem from
the magnetic interaction between different magnetic layers. Therefore, an element-specific magnetic
measurement would allow the identification of the magnetic interlayer coupling
on the new magnetic properties. The
recent development of the x-ray magnetic circular/linear dichroism
(XMCD, XMLD) makes it possible to do element-specific measurement for
ferromagnetic/antiferromagnetic materials with
monolayer sensitivity. In
particular, the combination of the XMCD/XMLD with electron microscopy allows
element-specific magnetic domain imaging.
In this talk, I will present some recent results from our group to
illustrate the application of the XMCD/XMLD on magnetic multilayers.